The X-MET XRF analyzer provides great light elements (Mg, Al, Si, P, S, Cl) analysis, low limits of detection, and outstanding precision for results you can trust, day after day. With its large touchscreen and icon-driven user interface, the user training required to operate the X-ray spectrometer analyzer is minimal.
Read More
X-ray fluorescence spectrometry (XRF) is a well-established analytical atomic technique for qualitative and quantitative chemical analysis of environmental samples with various matrices and a wide eleme.
Read More
Experience unparalleled precision in color analysis with our Handheld Spectrometer featuring a high-precision CCD sensor and multiple testing modes. A portable spectrophotometer is a valuable tool for capturing color data on a variety of surfaces on a printing press, in a lab, on a loading dock, or anywhere else your color needs take you. Shop Handheld Spectrometer Portable Spectrophotometer Spectral Illuminance Meter PPFD Meter PAR Quantum Meter with Accuracy 0. The GoSpectro is a device that turns any smartphone or tablet into an ultracompact and powerful light handheld spectrometer. Particle Measuring Systems (PMS) sets the standard for cleanroom contamination monitoring.
Read More
A fiber-optic splitter, also known as a beam splitter, is based on a quartz substrate of an integrated waveguide optical power distribution device, similar to a coaxial cable transmission system. The optical network system uses an optical signal coupled to the branch distribution. TypesAccording to the principle, fiber optic splitters can be divided into Fused Biconical Taper (FBT) splitter and.
Read More
Penetration Depends on Density: Heavier metals like gold allow for shallower X-ray penetration compared to lighter ones. This guide provides a comprehensive technical overview of the physics governing X-ray penetration, the factors that dictate information depth, and how to optimize XRF spectroscopic measurements for subsurface analysis. The penetration depth is not a fixed setting on the instrument; it is the result of a physical interaction between the X-ray beam and the specific material you are measuring. The depth of penetration can be calculated by the following equation: where I is the quantity of photons returning from the sample, I0 is the quantity of photons entering the sample, μ/ρ represents the mass attenuation coefficient of a given element for a particular matrix, and x represents the. ), Symposium on Strategic and Critical Materials Proceedings, November 13-14, 2015, Victoria, British Columbia.
Read More+48 22 538 72 19
ul. Postępu 14, 02-676 Warszawa, Poland